发明名称 SEMICONDUCTOR TESTER
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor tester, comprising a terminator which is capable of terminating with a proper waveform quality and accurately measuring the timing of a DUT with output pins, even when they have low current drive powers. SOLUTION: The semiconductor tester has a terminator, provided in pin electronics which terminates an output signal from an IC pin of a device under test (DUT) with a specified termination resistance. It comprises a means for reducing the load current, flowing in the terminating resistance as specified according to the current drive power at the output end of the DUT.
申请公布号 JP2003156528(A) 申请公布日期 2003.05.30
申请号 JP20010354219 申请日期 2001.11.20
申请人 ADVANTEST CORP 发明人 ISOBE KATSUMI;SEKINO TAKASHI;ICHIHASHI TOSHIHIRO
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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