发明名称 DEVICE AND METHOD FOR INSPECTION LIQUID CRYSTAL PANEL
摘要 PROBLEM TO BE SOLVED: To accurately and securely inspect pixel unevenness due to light leak. SOLUTION: On an inspection table 81, a liquid crystal panel 82 is provided. On the inspection base 81, a turntable 84 which is freely rotatable in a horizontal plane is provided and on the turntable 84, a light source unit 83 is provided. The light source unit 83 is able to make light incident on an incidence surface while changing by a specified angle the optical axis from the normal direction of the incidence surface of the liquid crystal panel 8. A control part 87 controls a rotary driving part 86 to rotate the light source unit 83 in the horizontal plane and then can set the incident light distribution of the light on the incidence surface of the liquid crystal panel 82 horizontally for each specified angle. Consequently, the characteristic of the pixel unevenness of the liquid crystal panel 82 due to light leak can accurately be detected.
申请公布号 JP2003156727(A) 申请公布日期 2003.05.30
申请号 JP20010357702 申请日期 2001.11.22
申请人 SEIKO EPSON CORP 发明人 KARASAWA KAZUKI
分类号 G01N21/958;G01M11/00;G02F1/13;G03B15/00;G03B15/02;(IPC1-7):G02F1/13 主分类号 G01N21/958
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