发明名称 Method of testing memory with continuous, varying data
摘要 A method of testing memory using continuous, varying data. More specifically, a method for testing whether a memory is weakened or damaged by continuously inputting and outputting varying data through the data I/O pins of the memory. At least a 75% data variation ratio on the test data is maintained to ensure high accuracy in detecting a weakened or damaged memory.
申请公布号 US2003101392(A1) 申请公布日期 2003.05.29
申请号 US20020131951 申请日期 2002.04.24
申请人 LEE CHEN-TSAI 发明人 LEE CHEN-TSAI
分类号 G11C29/10;(IPC1-7):G11C29/00 主分类号 G11C29/10
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