发明名称 Memory circuit having compressed testing function
摘要 A multi-bit output configuration memory circuit comprises: a memory core having a normal cell array and a redundant cell array, which have a plurality of memory cells; N output terminals which respectively output N-bit output read out from the memory core; an output circuit provided between the output terminals and the memory core, which detects whether each L-bit output of the N-bit output (N=LxM) read out from said memory core matches or not and outputs a compressed output which becomes the output data in the event of a match while becomes a third state in the event of a non-match, to a first output terminal of the N output terminals. Responding to each of a plurality of test commands or the test control signals of the external terminals, the compressed output of the M groups of L-bit output is outputted in time shared.
申请公布号 US2003099143(A1) 申请公布日期 2003.05.29
申请号 US20020270196 申请日期 2002.10.15
申请人 FUJITSU LIMITED 发明人 FUJIOKA SHINYA;FUJIEDA WAICHIRO;HARA KOTA
分类号 G01R31/28;G01R31/3185;G11C29/14;G11C29/34;G11C29/38;G11C29/40;(IPC1-7):G11C7/00 主分类号 G01R31/28
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