发明名称 |
METHOD FOR FABRICATING COMPLEMENTARY METAL OXIDE SEMICONDUCTOR IMAGE SENSOR |
摘要 |
PURPOSE: A method for fabricating a complementary metal oxide semiconductor(CMOS) image sensor is provided to improve photosensitivity of the whole image sensor by eliminating the loss of optical energy of the light incident on the center portion of a micro lens while being capable of condensing in the same way as a conventional technology. CONSTITUTION: A underlying layer(10) is prepared in which a relative device including a light receiving device and a color filter is formed. A micro lens(11) of a spacer shape is formed on the underlying layer corresponding to the periphery of the edge of the light receiving device.
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申请公布号 |
KR20030042302(A) |
申请公布日期 |
2003.05.28 |
申请号 |
KR20010073027 |
申请日期 |
2001.11.22 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HWANG, JUN |
分类号 |
H01L27/146;(IPC1-7):H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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