发明名称 |
Programmable leakage current offset for phase locked loop |
摘要 |
A method and apparatus for post-fabrication adjustment of a phase locked loop leakage current is provided. The adjustment system includes an adjustment circuit that adjusts a leakage current offset circuit to compensate for the leakage current of a capacitor in the phase locked loop. The capacitor connects to a control voltage of the phase locked loop. Such control of the leakage current in the phase locked loop allows a designer to achieve a desired phase locked loop operating characteristic after the phase locked loop has been fabricated.
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申请公布号 |
US6570421(B1) |
申请公布日期 |
2003.05.27 |
申请号 |
US20020230862 |
申请日期 |
2002.08.29 |
申请人 |
SUN MICROSYSTEMS, INC. |
发明人 |
GAUTHIER CLAUDE R.;TRIVEDI PRADEEP R.;AMICK BRIAN W. |
分类号 |
H03L7/089;H03L7/18;(IPC1-7):H03L7/06 |
主分类号 |
H03L7/089 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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