发明名称 Programmable leakage current offset for phase locked loop
摘要 A method and apparatus for post-fabrication adjustment of a phase locked loop leakage current is provided. The adjustment system includes an adjustment circuit that adjusts a leakage current offset circuit to compensate for the leakage current of a capacitor in the phase locked loop. The capacitor connects to a control voltage of the phase locked loop. Such control of the leakage current in the phase locked loop allows a designer to achieve a desired phase locked loop operating characteristic after the phase locked loop has been fabricated.
申请公布号 US6570421(B1) 申请公布日期 2003.05.27
申请号 US20020230862 申请日期 2002.08.29
申请人 SUN MICROSYSTEMS, INC. 发明人 GAUTHIER CLAUDE R.;TRIVEDI PRADEEP R.;AMICK BRIAN W.
分类号 H03L7/089;H03L7/18;(IPC1-7):H03L7/06 主分类号 H03L7/089
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