发明名称 |
ELECTRON ENERGY LOSS SPECTROSCOPE, ELECTRON MICROSCOPE EQUIPPED THEREWITH, AND ELECTRON ENERGY LOSS SPECTRUM MEASURING METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide accurate and reliable electron energy loss spectrum measuring device capable of measuring electron energy loss spectrum and THEM or STEM provided with the same. SOLUTION: A peak of spectrum is detected by an electron beam detector, a gap amount of the peak position from a reference position on the electron beam detector is detected, and the gap amount is corrected by using a control device controlling an electron beam position on the electron beam detector. Electron energy loss spectrum is measured while controlling the correction of a gap amount between an electron beam position on a sample and a peak position of a spectrum and spectrum measurement by the electron beam detector. An accurate electron energy loss spectrum is acquired with an electron microscope provided with the electron energy loss spectroscope.</p> |
申请公布号 |
JP2003151478(A) |
申请公布日期 |
2003.05.23 |
申请号 |
JP20010346019 |
申请日期 |
2001.11.12 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
KAJI KAZUTOSHI;AOYAMA TAKASHI;TAYA TOSHIMICHI;ISAGOZAWA SHIGETO |
分类号 |
G01N23/02;G21K5/04;H01J37/147;H01J37/28;(IPC1-7):H01J37/147 |
主分类号 |
G01N23/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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