发明名称 ELECTRON ENERGY LOSS SPECTROSCOPE, ELECTRON MICROSCOPE EQUIPPED THEREWITH, AND ELECTRON ENERGY LOSS SPECTRUM MEASURING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide accurate and reliable electron energy loss spectrum measuring device capable of measuring electron energy loss spectrum and THEM or STEM provided with the same. SOLUTION: A peak of spectrum is detected by an electron beam detector, a gap amount of the peak position from a reference position on the electron beam detector is detected, and the gap amount is corrected by using a control device controlling an electron beam position on the electron beam detector. Electron energy loss spectrum is measured while controlling the correction of a gap amount between an electron beam position on a sample and a peak position of a spectrum and spectrum measurement by the electron beam detector. An accurate electron energy loss spectrum is acquired with an electron microscope provided with the electron energy loss spectroscope.</p>
申请公布号 JP2003151478(A) 申请公布日期 2003.05.23
申请号 JP20010346019 申请日期 2001.11.12
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 KAJI KAZUTOSHI;AOYAMA TAKASHI;TAYA TOSHIMICHI;ISAGOZAWA SHIGETO
分类号 G01N23/02;G21K5/04;H01J37/147;H01J37/28;(IPC1-7):H01J37/147 主分类号 G01N23/02
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