发明名称 SUBSTRATE-PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To improve uniformity of film thickness by keeping the uniformity of temperature distribution within the plane of substrate due to the processing gas introduced in the substrate processing apparatus. SOLUTION: The substrate processing apparatus to perform the predetermined processes to a substrate 7, by supplying the processing gas thereto comprises a substrate-setting unit 4 for setting the substrate, a heat-generating unit 8 for heating the substrate, a processing gas inlet unit 21 for supplying the processing gas to the locations other than the main surface of substrate with the flow in a direction perpendicular to the main surface of substrate from the upper side of the main surface of substrate being set to the substrate setting unit, and a gas venting 15 for venting the introduced processing gas toward the external side of the substrate.
申请公布号 JP2003151970(A) 申请公布日期 2003.05.23
申请号 JP20010349081 申请日期 2001.11.14
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 SHINOZAKI KENJI
分类号 C23C16/455;H01L21/31;(IPC1-7):H01L21/31 主分类号 C23C16/455
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