MEMORY UNIT TEST

摘要

The invention relates to a method and device for operating and/or testing memory units, which make it possible to conduct a time-saving test of semiconductor memories during running operation. The inventive method for testing memory units (2) having storage locations (1) provides that, for the storage locations (1), a first item of test information is formed according to a variable parameter assigned to the respective storage location (1) and according to the contents of the respective storage location (1).