发明名称 Low capacitance probe contact
摘要 A low capacitance probe contact has electrically conductive contacts having fingers with opposing interior flat surfaces forming a slit there between. The fingers extend in a first direction with a mounting member extending in the opposite direction having a flat surface that is parallel to the flat surfaces of the fingers. The first and second electrically conductive contacts are secured to respective first and second electrically conductive contact pads formed on a substrate with the flat surfaces of the mounting members being positioned on the contact pads. The substrate and the electrically conductive contacts are captured within a housing having first and second members. One member has a base and extending sidewalls forming a recess that receives the substrate and the electrically conductive contacts and the other member has a periphery coextensive with the first member to capture the substrate and the electrically conductive contacts therein.
申请公布号 US2003094960(A1) 申请公布日期 2003.05.22
申请号 US20010990928 申请日期 2001.11.16
申请人 LYFORD J. STEVE;VILHAUER MIKE A. 发明人 LYFORD J. STEVE;VILHAUER MIKE A.
分类号 G01R1/067;(IPC1-7):G01R27/08 主分类号 G01R1/067
代理机构 代理人
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