发明名称 Semiconductor device, manufacturing method therefor, and semiconductor manufacturing apparatus
摘要 An a-Si film is patterned into a linear shape (ribbon shape) or island shape on a glass substrate. The upper surface of the a-Si film or the lower surface of the glass substrate is irradiated and scanned with an energy beam output continuously along the time axis from a CW laser in a direction indicated by an arrow, thereby crystallizing the a-Si film. This implements a TFT in which the transistor characteristics of the TFT are made uniform at high level, and the mobility is high particularly in a peripheral circuit region to enable high-speed driving in applications to a system-on glass and the like.
申请公布号 US2003094585(A1) 申请公布日期 2003.05.22
申请号 US20020293753 申请日期 2002.11.13
申请人 FUJITSU LIMITED, 发明人 HARA AKITO;TAKEUCHI FUMIYO;YOSHINO KENICHI;SASAKI NOBUO
分类号 G02F1/1345;G02F1/136;H01L21/20;H01L21/268;H01L21/336;H01L29/786;(IPC1-7):H01L21/20;H01L21/26;H01L21/324;H01L21/42;H01L21/477 主分类号 G02F1/1345
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