发明名称 Polymer, resist composition and patterning process
摘要 A polymer comprising recurring units of formula (1) and having a Mw of 1,000-500,000 is provided.R1 is H, methyl or CH2CO2R3, R2 is H, methyl or CO2R3, R3 is alkyl, R4 is H, alkyl, alkoxyalkyl or acyl, R5 and R15 are acid labile groups, and at least one of R6 to R9 is a carboxyl or hydroxyl-containing monovalent hydrocarbon group, and the reminders are H or alkyl, at least one of R10 to R13 is a monovalent hydrocarbon group containing a -CO2- partial structure, and the reminders are H or alkyl, R14 is a polycyclic hydrocarbon group or polycyclic hydrocarbon-containing alkyl group, Z is a trivalent hydrocarbon group, k=0 or 1, x is>0, a, b, c and d are>=0, satisfying x+a+b+c+d=1. A resist composition comprising the polymer has significantly improved sensitivity, resolution and etching resistance and is very useful in microfabrication.
申请公布号 US6566037(B2) 申请公布日期 2003.05.20
申请号 US20010797878 申请日期 2001.03.05
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 NISHI TSUNEHIRO;HASEGAWA KOJI;WATANABE TAKERU;KINSHO TAKESHI;HATAKEYAMA JUN
分类号 G03F7/004;C08F232/08;G03F7/039;(IPC1-7):G03F7/038;C08F10/00 主分类号 G03F7/004
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