发明名称 Semiconductor die package with improved thermal and electrical performance
摘要 A semiconductor die package is disclosed. In one embodiment, the package includes a semiconductor die comprising a vertical power transistor. A source electrode and a gate contact region are at the first surface of the semiconductor die. A drain electrode is at the second surface of the semiconductor die. A base member is proximate to the second surface of the semiconductor die and is distal to the first surface of the semiconductor die and a cover disposed over the first surface of the semiconductor die. The cover is coupled to the base member and is adapted to transfer beat away from the semiconductor die.
申请公布号 US6566749(B1) 申请公布日期 2003.05.20
申请号 US20020050428 申请日期 2002.01.15
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION 发明人 JOSHI RAJEEV;SAPP STEVEN
分类号 H01L21/60;H01L23/04;H01L23/367;(IPC1-7):H01L23/10;H01L23/34 主分类号 H01L21/60
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