发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PURPOSE: To provide a semiconductor device in which connection reliability and stability are improved when a bonding wire is bonded to a bonding pad in a semiconductor device with a multilayer wiring structure using a copper wire, and a method of manufacturing the same. CONSTITUTION: A third layer wire 17 and a bonding pad 71, both of which are made of aluminum alloys, are partially formed on a second interlayer insulating film 14. An open hole 74 having a bottom surface defined by the bonding pad 71 is partially formed in a third interlayer insulating film 63, fourth interlayer insulating film 67, protection insulating film 72 and buffer coating film 73. A bonding wire 75 is inserted through the open hole 74 and bonded to the bonding pad 71. |
申请公布号 |
KR20030038324(A) |
申请公布日期 |
2003.05.16 |
申请号 |
KR20020034553 |
申请日期 |
2002.06.20 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
IZUMITANI JUNKO;TAKEWAKA HIROKI |
分类号 |
H01L23/52;H01L21/3205;H01L21/60;H01L21/768;H01L21/82;H01L23/485;H01L23/522;H01L23/532 |
主分类号 |
H01L23/52 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|