Self test method and device for dynamic voltage screen functionality improvement

摘要

Disclosed is a device that includes a built-in-self-test controller having a mechanism for providing an interface signal that indicates whether a dynamic voltage screen (DVS) test is being performed. The self-test controller is associated with a memory array that includes a clock having a clock speed. The memory array also includes a clock adjuster that receives the interface signal and reduces the clock speed when the interface signal indicates that a DVS test is being performed.