Integrated circuit design and testing,申请号GB20030008070-传众专利搜索

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发明名称	Integrated circuit design and testing
摘要
申请公布号	GB0308070(D0)	申请公布日期	2003.05.14
申请号	GB20030008070	申请日期	2003.04.08
申请人	ZARLINK SEMICONDUCTOR LIMITED	发明人
分类号	G06F9/45;G06F17/50	主分类号	G06F9/45
代理机构		代理人
主权项
地址

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