| 摘要 |
The invention relates to an X-ray examination apparatus which includes an X-ray source, an X-ray detector, absorption means arranged between the X-ray source and the X-ray detector, a control unit for adjusting the absorption degree of the absorption means, an image processing unit and a display unit. In order to perform an automatic adjustment of the absorption means, the absorption degree therein is optimized in dependence on user-specific parameters (r) and/or apparatus-specific parameters (s) and/or structure parameters (<DULINE>C</DULINE>) and/or parameters (r) classifying the subject matter of the image.
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