SEMICONDUCTOR DEVICE PROVIDED WITH TEMPERATURE DETECTION FUNCTION AND TEST METHOD, AND CONTROL METHOD FOR SEMICONDUCTOR MEMORY PROVIDED WITH TEMPERATURE DETECTION FUNCTION

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor device provided with temperature detection function detecting the prescribed temperature with less dispersion and optimizing an operation state in accordance with the detected prescribed temperature, a test method, and a refresh-control method. SOLUTION: This device is provided with a memory cell 26, a refresh-control circuit 25 switching refresh-period tREF, and a temperature detecting section 12A biased by bias voltage VB+ from a voltage bias section 11 provided with a reference section 13 and a regulator section 14. Control of the refresh-control circuit 25 is switched by detection of the prescribed temperature tx0 by the temperature detecting section 12A, current consumption IDD in a low temperature region can be reduced keeping a data holding characteristic of the memory cell 26 in whole temperature range by performing refresh-operation with a short period in a high temperature region, with a long period in a low temperature region.