发明名称 Method of reducing carbon incorporation into films produced by chemical vapor deposition involving organic precursor compounds
摘要 A chemical vapor deposition method of providing a layer of material atop a semiconductor wafer using an organic precursor includes, a) positioning a wafer within a chemical vapor deposition reactor; b) injecting an organic precursor to within the reactor having the wafer positioned therein, and maintaining the reactor at a temperature and a pressure which in combination are effective to deposit a first layer of material onto the wafer which incorporates carbon from the organic precursor; and c) after depositing the first layer, ceasing to inject the organic precursor into the reactor and injecting a component gas into the reactor and generating a plasma within the reactor against the first layer, the component gas and plasma generated therefrom having a component which is effective when in an activated state to interact with a component of the deposited first layer to remove carbon from the first layer and produce gaseous products which are expelled from the reactor. In one aspect, the component gas provides a bonding component which replaces and substitutes for the carbon displaced from carbide present in the layer. In another aspect, the "b" and "c" steps are repeated to deposit more of the same layers.
申请公布号 US2003087472(A1) 申请公布日期 2003.05.08
申请号 US20020321047 申请日期 2002.12.16
申请人 SANDHU GURTEJ S 发明人 SANDHU GURTEJ S.
分类号 B05D3/06;C23C14/02;C23C16/44;C23C16/455;C23C16/56;H01L21/285;H01L21/31;H01L21/44;H01L21/70;H01L51/40;H05H1/00;(IPC1-7):H01L51/40 主分类号 B05D3/06
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