发明名称 |
DEVICE, JIG, AND METHOD FOR INSPECTING ELECTRONIC COMPONENT |
摘要 |
PROBLEM TO BE SOLVED: To prevent a contact sheet or electronic component from being scratched or broken at the time of inspecting the electronic component by using the contact sheet. SOLUTION: At the time of inspecting an IC 4 to be inspected by means of an inspection circuit arranged on an inspection substrate 2 by electrically connecting the lead terminals 41 of the IC 4 to the inspection circuit through the contact sheet 3a, protective metallic plates 12 corresponding to the lead terminals 41 of the IC 4 are arranged between the lead terminals 41 and the contact sheet 3a by using an IC guide jig 1 having the protective metallic plates 12 and the inspection circuit is electrically connected to the lead terminals 41 of the IC 4 through the metallic plates 12.
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申请公布号 |
JP2003130914(A) |
申请公布日期 |
2003.05.08 |
申请号 |
JP20010326613 |
申请日期 |
2001.10.24 |
申请人 |
SONY CORP |
发明人 |
SAKAMOTO ITSUO |
分类号 |
G01R31/26;G01R1/073;G01R31/28;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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