发明名称 DEVICE, JIG, AND METHOD FOR INSPECTING ELECTRONIC COMPONENT
摘要 PROBLEM TO BE SOLVED: To prevent a contact sheet or electronic component from being scratched or broken at the time of inspecting the electronic component by using the contact sheet. SOLUTION: At the time of inspecting an IC 4 to be inspected by means of an inspection circuit arranged on an inspection substrate 2 by electrically connecting the lead terminals 41 of the IC 4 to the inspection circuit through the contact sheet 3a, protective metallic plates 12 corresponding to the lead terminals 41 of the IC 4 are arranged between the lead terminals 41 and the contact sheet 3a by using an IC guide jig 1 having the protective metallic plates 12 and the inspection circuit is electrically connected to the lead terminals 41 of the IC 4 through the metallic plates 12.
申请公布号 JP2003130914(A) 申请公布日期 2003.05.08
申请号 JP20010326613 申请日期 2001.10.24
申请人 SONY CORP 发明人 SAKAMOTO ITSUO
分类号 G01R31/26;G01R1/073;G01R31/28;(IPC1-7):G01R31/26 主分类号 G01R31/26
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