发明名称 THIN FILM DELAMINATION DETECTION
摘要 An apparatus and method for detecting and marking delamination defects on thin film disks are disclosed. The apparatus includes a read/write (R/W) head and a burnishing head mounted on separate arms that access the disk while spinning on the test stand. The controller uses the R/W head to perform an initial magnetic test of selected areas on the disk to establish an initial defect map. The burnish head is then flown over the surface for an extended time to accelerate and open up the latent delamination defects by impacting protruding material. The R/W head is then used to perform a second magnetic test which is compared against the first test to identify the delamination defects which have been developed by the burnishing. The delamination defects are then marked with a magnetic pattern which aids in optically locating the defect during subsequent failure analysis.
申请公布号 US2003085701(A1) 申请公布日期 2003.05.08
申请号 US20010053016 申请日期 2001.11.02
申请人 BAUMGARTNER BRADLEY FREDERICK;DUAN SHANLIN;LIU YAN;ROBINSON BOB C;TANG LI;WONG KA CHI 发明人 BAUMGARTNER BRADLEY FREDERICK;DUAN SHANLIN;LIU YAN;ROBINSON BOB C.;TANG LI;WONG KA CHI
分类号 G01R33/12;G11B5/00;G11B5/012;G11B5/82;G11B19/04;G11B20/18;G11B27/36;G11B33/10;(IPC1-7):G01R33/12 主分类号 G01R33/12
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