发明名称 A method of forming a silicon dioxide layer on a curved Si surface
摘要 The present invention refers to a method of forming a silicon dioxide layer by thermally oxidizing at least one monocrystalline silicon surface region on a semiconductor substrate, said silicon surface region having a curved surface. The present invention is advantageously applicable for the formation of the collar region in the upper part of the trench of a DRAM (Dynamic Random Acess Memory) cell. The method comprises the steps of providing a semiconductor substrate (1) having at least one monocrystalline silicon surface region having a curved surface, roughening the surface of said at least one monocrystalline silicon surface region so as to produce a layer of porous silicon, and thermally oxidizing (9) said at least one roughened monocrystalline silicon surface. <IMAGE>
申请公布号 EP1306894(A1) 申请公布日期 2003.05.02
申请号 EP20010125000 申请日期 2001.10.19
申请人 INFINEON TECHNOLOGIES AG 发明人 GOLDBACH, MATTHIAS, DR.;SPERL, IRENE;BIRNER, ALBERT, DR.
分类号 H01L21/3063;H01L21/316;H01L21/8242;H01L27/108 主分类号 H01L21/3063
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