发明名称 Field-effect transistor
摘要 A field-effect transistor has a composite channel structure having a first channel layer containing GaInP semiconductor and a second channel layer containing GaAs semiconductor. When the electric field is low in the channel, a channel current is primarily conducted in the second channel layer. When the electric field is high, the electrons flowing in the second channel layer move through real space transition to the first channel layer. These electrons conduct in the channel primarily in the first channel layer. Since GaInP semiconductor has a wider forbidden bandwidth than that of GaAs semiconductor, the avalanche breakdown voltage of GaInP semiconductor is higher than that of GaAs semiconductor. When the electric field is high, the conduction electrons travel in this GaInP semiconductor layer. This also improves the avalanche breakdown voltage of the field-effect transistor.
申请公布号 US6555850(B1) 申请公布日期 2003.04.29
申请号 US20000505700 申请日期 2000.02.17
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 SAKAMOTO RYOJI;NAKAJIMA SHIGERU
分类号 H01L29/812;H01L21/338;H01L29/778;(IPC1-7):H01L31/032;H01L31/033;H01L31/072;H01L31/09 主分类号 H01L29/812
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