发明名称 Pupil filtering for a lithographic tool
摘要 A mask or reticle is optimized for use in a lithographic system. The mask or reticle includes a substrate and a pupil filter pattern. The substrate includes an IC pattern representing at least one integrated circuit feature. The pupil filter pattern can enhance the resolution associated with the lithographic system.
申请公布号 US6555274(B1) 申请公布日期 2003.04.29
申请号 US20010775062 申请日期 2001.02.01
申请人 KYE JONGWOOK;LA FONTAINE BRUNO M. 发明人 KYE JONGWOOK;LA FONTAINE BRUNO M.
分类号 G03F1/14;G03F7/20;(IPC1-7):G03F9/00 主分类号 G03F1/14
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