发明名称 Method of extracting timing characteristics of transistor circuits, storage medium storing timing characteristic library, LSI designing method, and gate extraction method
摘要 A method of extracting timing characteristics from transistor circuit data of modularity design products (a module) such as a CPU core in which the extracted timing characteristics are used for the timing verification of a circuit including a module to be extracted and timing constraints when logical synthesis or timing-driven layout is made. Particularly, since conditions fit for a timing rule of the module are included in timing characteristics when timing verification is executed by simulation, verification free of pseudo error is enabled. Also, the configuration of a timing characteristic library, a storage medium storing it and an LSI designing method using the storage medium are provided.
申请公布号 US6557150(B1) 申请公布日期 2003.04.29
申请号 US20000485169 申请日期 2000.02.07
申请人 HITACHI, LTD. 发明人 HONMURA TETSUROO;NAKAJIMA TAKASHI;GOTO KENZO;WATANABE SHOICHI
分类号 G06F17/50;(IPC1-7):G06K17/50 主分类号 G06F17/50
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