发明名称 Semiconductor device and producing method thereof
摘要 The present invention is a method of producing a semiconductor device in which at least one alignment mark to be used in an exposure process of a lithographic process is formed of a wiring material which is copper or includes copper as a main component, and the alignment mark is formed entirely in an area outside an area where dicing is to be executed.
申请公布号 US6555925(B1) 申请公布日期 2003.04.29
申请号 US20000517187 申请日期 2000.03.02
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 HIGASHI KAZUYUKI;MATSUNAGA NORIAKI;KAJITA AKIHIRO;TAKASE TAMAO;KANEKO HISASHI;SHIBATA HIDEKI
分类号 H01L21/301;H01L23/544;(IPC1-7):H01L23/544 主分类号 H01L21/301
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