发明名称 METHOD FOR DEPOSITING SiC:H FILM AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for depositing an SiC:H film having a low dielectric constant and desirable characteristics. SOLUTION: The method for manufacturing a semiconductor device comprises a step (a) for forming a semiconductor element on a semiconductor substrate, a step (b) for depositing an SiC:H film by repeating growth and stopping growth two times or more under a low pressure atmosphere, and a step (c) for forming an insulating cap layer on the SiC film or the SiC:H film.
申请公布号 JP2003124209(A) 申请公布日期 2003.04.25
申请号 JP20010320398 申请日期 2001.10.18
申请人 FUJITSU LTD 发明人 SUGIURA IWAO;NAKADA YOSHIHIRO;SUZUKI KATSUMI;YANO EI
分类号 H01L21/768;H01L21/314;H01L23/522;(IPC1-7):H01L21/314 主分类号 H01L21/768
代理机构 代理人
主权项
地址