发明名称 |
METHOD FOR DEPOSITING SiC:H FILM AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for depositing an SiC:H film having a low dielectric constant and desirable characteristics. SOLUTION: The method for manufacturing a semiconductor device comprises a step (a) for forming a semiconductor element on a semiconductor substrate, a step (b) for depositing an SiC:H film by repeating growth and stopping growth two times or more under a low pressure atmosphere, and a step (c) for forming an insulating cap layer on the SiC film or the SiC:H film.
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申请公布号 |
JP2003124209(A) |
申请公布日期 |
2003.04.25 |
申请号 |
JP20010320398 |
申请日期 |
2001.10.18 |
申请人 |
FUJITSU LTD |
发明人 |
SUGIURA IWAO;NAKADA YOSHIHIRO;SUZUKI KATSUMI;YANO EI |
分类号 |
H01L21/768;H01L21/314;H01L23/522;(IPC1-7):H01L21/314 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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