发明名称 |
Quantitative position assessment device for machine parts e.g. shaft, workpiece, has two-dimensionally readable optoelectronic sensor which reflects incident light beam directly to another optoelectronic sensor |
摘要 |
An optoelectronically active layer of two-dimensionally readable optoelectronic sensor (110), reflects the incident light beam (25) directly to the two-dimensionally readable optoelectronic sensor (120).
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申请公布号 |
DE10147139(A1) |
申请公布日期 |
2003.04.24 |
申请号 |
DE20011047139 |
申请日期 |
2001.09.25 |
申请人 |
SIEMENS AG |
发明人 |
HALFMANN, RUEDIGER;LOTT, MATTHIAS;RADIMIRSCH, MARKUS;SCHULZ, EGON |
分类号 |
H04B7/26;H04L7/04;H04W88/02;(IPC1-7):H04L7/06;H04Q7/20 |
主分类号 |
H04B7/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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