| 摘要 |
Disclosed is an interface (300) for providing an electrical contact between a test equipment (25, 30) and an application equipment (10, 20). The interface (300) is adapted for receiving a plurality of individual segments (320i), whereby at least one of the segments (320i) comprises at least one electrical path (120, 130) for providing the electrical contact. At least one of the segments (320i) might be electrically isolated with respect to the interface (300) and/or other segments (320i), and can, have a ground condition substantially independent of the ground condition of the interface (300) and/or other segments (320i).
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