发明名称 GRAIN-SIZE MEASUREMENT
摘要 Grain sizes, for example in a sheet (12), are monitored by generating broadband ultrasonic waves with a pulse laser generator (14) at a first location (18) on a surface of the object, and observing with a laser detectro (20, 36) the waves on the surface at a different location (A). The ultrasonic spectrum for those waves that arrive at arrival times after that of the Rayleigh waves or the start of the A0 Lamb waves is determined, and the high frequency power is compared to the low frequency power. This ratio gives a consistent relationship to grain sizes. With copper sheets the frequency windows may be 1 to 3 MHz as the low frequency region, and 2.2 to 15 MHz as the high frequency region.
申请公布号 WO02103347(A3) 申请公布日期 2003.04.24
申请号 WO2002GB02716 申请日期 2002.06.12
申请人 ACCENTUS PLC;SMITH, ALLAN, PETER;SCRUBY, CHRISTOPHER, BRIAN;MOSS, BRIAN, CECIL 发明人 SMITH, ALLAN, PETER;SCRUBY, CHRISTOPHER, BRIAN;MOSS, BRIAN, CECIL
分类号 G01N29/24;G01N29/30;G01N29/42;G01N29/46 主分类号 G01N29/24
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