发明名称 METHOD FOR IMPROVED WAFER ALIGNMENT
摘要 <p>A method for improving alignment of a transparent or semi-transparent workpiece (20) consisting of silicone wafer (30, 32) for integrated circuits undergoing multi-step processing during their manufacturing process, the method comprising: providing laser patterning system comprising an ultra-short pulsed laser source (10) for generating an ultra-short pulsed beam, optical elements for directing and focusing the beam at predetermined target locations within the workpiece (20), and control unit (24) for controlling the ultra-short pulsed laser source (10) and the optical elements, so as to produce a predetermined pattern inscribed within the workpiece (20); and inscribing a predetermined pattern within the workpiece (20).</p>
申请公布号 WO03033199(A1) 申请公布日期 2003.04.24
申请号 WO2002IL00819 申请日期 2002.10.10
申请人 U.C. LASER LTD.;ZAIT, EITAN 发明人 ZAIT, EITAN
分类号 B23K26/00;B23K26/06;B23K26/08;H01L21/00;H01L23/544;(IPC1-7):B23K26/00 主分类号 B23K26/00
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