SEMICONDUCTOR INTEGRATED CIRCUIT WITH BUILT-IN TEST FUNCTION, STORAGE MEDIUM FOR STORING ELECTRONIC DESIGN DATA COMPRISING TEST CODE GENERATION PROGRAM, TEST METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT, TEST CODE GENERATION AUTOMATIZING METHOD AND ITS PROGRAM

摘要

PROBLEM TO BE SOLVED: To reduce a test execution time without increasing the quantity of test data, in a built-in test using a decode circuit. SOLUTION: This semiconductor integrated circuit 500 provided with a built-in test (BIT) function is equipped with a test code auxiliary register 504 for storing a code of a pattern generation circuit 502, a clock generation circuit 510 and a BIT control circuit 520, and has a function for setting a code required for the next self-test execution concurrently with executing a self-test and a function for shifting to the next self-test execution immediately after finishing one self-test execution. A test device 530 periodically observes a self-test termination signal BEND during the self-test execution and starts to apply the next code to the integrated circuit 500 immediately after observing the signal showing the termination.