发明名称 Method of utilizing fabrication process of floating gate spacer to build twin-bit monos/sonos memory
摘要 The present invention discloses a method of utilizing the fabrication process of floating gate spacer to build a twin-bit MONOS/SONOS memory, wherein recessed ONO spacers are used to fabricate a discontinuous floating gate below a poly control gate to obtain a MONOS/SONOS memory device having twinbit memory cells. Cross talk between charges stored in the two bits can be avoided, hence enhancing the reliability of memory device. Moreover, if the voltage Vt varies during the fabrication process, the device can restore its normal characteristics through the individual and separate characteristic of the two bits and by using program or erase condition. The present invention can utilize the fabrication process of ONO spacer to complete the fabrication process of floating gate in automatic alignment way without the need of undergoing several mask processes.
申请公布号 US6551880(B1) 申请公布日期 2003.04.22
申请号 US20020146876 申请日期 2002.05.17
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LAI ERH-KUN;LIU CHIEN-HUNG;HUANG SHOU WEI;PAN SHYI-SHUH;CHEN YING TZOO
分类号 H01L21/28;H01L21/336;H01L21/8246;H01L21/8247;H01L27/115;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/28
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