发明名称 METHOD OF CLEANING CONTACT REGION OF METALLIC WIRE
摘要 PURPOSE: A method of cleaning a contact region of a metallic wire is provided to prevent the low permittivity interlayer dielectric from being deteriorated by forming a nitride film barrier at the sidewall of the interlayer dielectric within the contact region. CONSTITUTION: A metallic wire(22) and an interlayer dielectric(24) are sequentially formed on a substrate(21). The interlayer dielectric(24) is selectively removed to thereby form a contact region. A nitrogen-based radical is soaked into the contact region to thereby form a nitride film barrier(28) at the sidewall of the interlayer dielectric(24). Argon ions are sputtered into the contact region to thereby remove the surface residue on the metallic wire(22). The contact region suffers reactive cleaning such that the metallic oxide film on the exposed portion of the metallic wire(22) is removed. A plasma surface treatment is made with respect to the contact region using a nitrogen-based radical to thereby remove the reaction by-products attached to the sidewall of the interlayer dielectric(22).
申请公布号 KR20030030268(A) 申请公布日期 2003.04.18
申请号 KR20010062127 申请日期 2001.10.09
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, DONG JUN
分类号 H01L21/3213;H01L21/311;H01L21/768;(IPC1-7):H01L21/321 主分类号 H01L21/3213
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