发明名称 |
SEMICONDUCTOR EPITAXIAL WAFER AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a novel semiconductor epitaxial wafer with which the occurrence of the warpage an crack of the wafer can be effectively suppressed and a method for manufacturing the same. SOLUTION: The semiconductor epitaxial wafer 1 which is grown with a crystalline layer 3 having a lattice constant and coefficient of thermal expansion on the front surface of a substrate 2 by a vapor phase growth method of an organic metal is provided with a stress offsetting layer 4 for imparting a tensile stress to the substrate 2 on the rear surface side of the substrate 2. Consequently, the tensile stress generated in the crystalline layer 3 from the rear surface side of the substrate 2 is offset and therefore the trouble, such as the warpage of the substrate after cooling and the crack by the warpage can be effectively suppressed.
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申请公布号 |
JP2003113000(A) |
申请公布日期 |
2003.04.18 |
申请号 |
JP20010310195 |
申请日期 |
2001.10.05 |
申请人 |
HITACHI CABLE LTD |
发明人 |
FURUYA TAKASHI;NAGAI HISATAKA |
分类号 |
C30B29/38;C30B25/18;H01L21/205;(IPC1-7):C30B29/38 |
主分类号 |
C30B29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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