发明名称 SEMICONDUCTOR EPITAXIAL WAFER AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a novel semiconductor epitaxial wafer with which the occurrence of the warpage an crack of the wafer can be effectively suppressed and a method for manufacturing the same. SOLUTION: The semiconductor epitaxial wafer 1 which is grown with a crystalline layer 3 having a lattice constant and coefficient of thermal expansion on the front surface of a substrate 2 by a vapor phase growth method of an organic metal is provided with a stress offsetting layer 4 for imparting a tensile stress to the substrate 2 on the rear surface side of the substrate 2. Consequently, the tensile stress generated in the crystalline layer 3 from the rear surface side of the substrate 2 is offset and therefore the trouble, such as the warpage of the substrate after cooling and the crack by the warpage can be effectively suppressed.
申请公布号 JP2003113000(A) 申请公布日期 2003.04.18
申请号 JP20010310195 申请日期 2001.10.05
申请人 HITACHI CABLE LTD 发明人 FURUYA TAKASHI;NAGAI HISATAKA
分类号 C30B29/38;C30B25/18;H01L21/205;(IPC1-7):C30B29/38 主分类号 C30B29/38
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