| 摘要 |
<p>A translator fixture for use in testing high frequency or high speed digital circuit boards. The fixture has a pin supporting top plate (29) and base plate (32) and coaxial constant impedance test pins (23) incorporated into the fixture to provide a signal path from a test analyzer to the circuit board (16) under test. The board under test is coupled to an upper surface of the top plate. The impedance of the coaxial pins is matched to the impedance of the board under test as well as the impedance of the test analyzer. Force exerted on the coaxial pins ensures contact of the pins with test points on the circuit board under test. The force may be exerted by spring loaded probes (12) mounted on a compliant test interface (10) below the base plate. The force may also be exerted by Euler buckling the pins by relative movement between the circuit board under test and a second circuit board coupled to the base plate or to the test analyzer.</p> |
