发明名称 Chemical vapor deposition process for depositing titanium silicide films from an organometallic compound
摘要 A process for depositing titanium silicide films via chemical vapor deposition takes place in a deposition chamber that has been evacuated to less than atmospheric pressure and utilizes, as reactants, the organometallic compound tertiary-butyltris-dimethylamido-titanium and a silicon-containing compound such as silane.
申请公布号 US2003072892(A1) 申请公布日期 2003.04.17
申请号 US20020300327 申请日期 2002.11.19
申请人 AKRAM SALMAN 发明人 AKRAM SALMAN
分类号 C23C16/42;(IPC1-7):C23C16/00 主分类号 C23C16/42
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