发明名称 In-situ balancing for phase-shifting mask
摘要 The present invention describes a method of forming a mask comprising: providing a substrate, the substrate having a first thickness; forming a balancing layer over the substrate, the balancing layer having a second thickness; forming an absorber layer over the balancing layer, the absorber layer having a first region separated from a second region by a third region; removing the absorber layer in the first region and the second region; removing the balancing layer in the second region; and reducing the substrate in the second region to a third thickness. The present invention also describes a mask comprising: an absorber layers the absorber layer having a first opening and a second opening, the first opening uncovering a balancing layer disposed over a substrate having a first thickness, and the second opening uncovering the substrate having a second thickness.
申请公布号 US6548417(B2) 申请公布日期 2003.04.15
申请号 US20010957571 申请日期 2001.09.19
申请人 INTEL CORPORATION 发明人 DAO GIANG;QIAN QI-DE
分类号 G03F1/00;(IPC1-7):H01L21/302;H01L21/461;G03F9/00;G03C5/00 主分类号 G03F1/00
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