发明名称 CHARACTERISTIC ADJUSTING CIRCUIT
摘要 <p>PROBLEM TO BE SOLVED: To provide a multi-chip module of characteristic adjusting circuit formed of semiconductor chips which assure matched characteristics and can be attained easily to lower the fabrication cost in order to solve the requirements in needs of users, fabrication cost and timely supply of products or the like. SOLUTION: This characteristic adjusting circuit comprises a characteristic detecting circuit for extracting characteristics of semiconductor chip, a characteristic difference detecting circuit for detecting characteristic difference, and a voltage control circuit for generating an operation voltage of the semiconductor chip.</p>
申请公布号 JP2003110024(A) 申请公布日期 2003.04.11
申请号 JP20010301011 申请日期 2001.09.28
申请人 MITSUBISHI ELECTRIC CORP 发明人 YAMAZAKI SEIICHI;YOKOYAMA MASAHIRO
分类号 H01L25/18;H01L21/822;H01L25/04;H01L27/04;(IPC1-7):H01L21/822 主分类号 H01L25/18
代理机构 代理人
主权项
地址