发明名称 METHOD AND DEVICE FOR INSPECTING DEFECT OF CONTOUR SHAPE
摘要 PROBLEM TO BE SOLVED: To accurately inspect (recognize) a defect of a product mark and to accurately inspect the external appearance of the product. SOLUTION: In the method for inspecting the detect of contour shape, a template image is inputted, edge information of the inputted template image is extracted, distortion of the extracted edge information is corrected, an R-table is prepared from the corrected edge information, and the R-table is used to prepare a defect check template for a two-dimensional image; besides a work image is inputted, edge information of the work image is extracted, the R-table is used to perform generalization Haugh transform of the edge information subjected to distortion correction, the position, angle and size of the transformed information are corrected, an edge image is reproduced from the corrected edge information, and the reproduced edge image is compared with the defect check template to inspect the defect with the difference image.
申请公布号 JP2003109017(A) 申请公布日期 2003.04.11
申请号 JP20010298735 申请日期 2001.09.28
申请人 HITACHI LTD;HITACHI YONEZAWA ELECTRONICS CO LTD 发明人 TAKAHASHI HIROSHI;TAKEDA TAKAKO
分类号 G01B11/30;G01B11/24;G01N21/88;G06T1/00;G06T7/60 主分类号 G01B11/30
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