发明名称 Polishing tool used for CMP
摘要 A polishing tool used for a CMP process is disclosed. The polishing tool includes a polishing platen for holding a wafer faced-up thereon and carrying the wafer to move to and fro between a first position and a second position, a polishing pad for polishing the wafer, and a holder for holding the polishing pad to self-rotate and carrying the polishing pad to move across the wafer surface and further driving the polishing pad to polish the wafer.
申请公布号 US2003068965(A1) 申请公布日期 2003.04.10
申请号 US20020126183 申请日期 2002.04.19
申请人 PROMOS TECHNOLOGIES, INC. 发明人 YI CHAMPION
分类号 B24B37/04;B24B41/06;(IPC1-7):B24B1/00;B24B7/19 主分类号 B24B37/04
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