| 摘要 |
PROBLEM TO BE SOLVED: To improve the design efficiency of a design method by enabling the change of an expectation generation circuit easily in a short time. SOLUTION: In a test method of semiconductor device, data acquired by supplying a semiconductor circuit to be tested with a random pattern are compressed, and compared with an expectation, the method is characterized by providing either of a first cell 36A for selecting and outputting A between A and B inputted corresponding to the expectation in each of all bits or a part of bits constituting the expectation and a second cell 36B for selecting and outputting B, and forming the expectation ED1-EDn by the output of the first and second cells.
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