发明名称 INSULATION DEGRADATION DETECTING METHOD AND INSULATION LIFE PREDICTING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To obtain an insulation degradation detecting method capable of detecting degradation in an insulating layer at an early stage, by directly measuring the state of degradation in the solid insulation layer of an electric apparatus, and an insulation life predicting method capable of predicting the life (remaining life) of the insulating layer. SOLUTION: With attention given to resin hydrolysis considered to be one of chemical degradations in the solid insulating layer containing a resin, a coil insulating layer 2 is directly sampled and analyzed to detect and determine a specific organic acid, which is a resin hydrolysate.</p>
申请公布号 JP2003107075(A) 申请公布日期 2003.04.09
申请号 JP20010301025 申请日期 2001.09.28
申请人 MITSUBISHI ELECTRIC CORP 发明人 TSUJI HIROKO
分类号 G01R31/06;G01N21/35;G01N21/3563;G01N30/06;G01N30/88;G01N33/44;G01R31/12;G01R31/34;H01F41/00;(IPC1-7):G01N33/44 主分类号 G01R31/06
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