发明名称 CHEMICAL-MECHANICAL POLISHING APPARATUS, POLISHING PAD, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 The present invention is a chemical mechanical polishing apparatus which polishes a substrate by causing relative movement of this substrate and a polishing pad in a state in which a polishing liquid is interposed between this polishing pad and the substrate, wherein the shape of the above-mentioned polishing pad is an annular shape in which the central portion of a circle or ellipse is bored through in a circular or elliptical shape that has a smaller diameter. The internal diameter li of the hole that is bored through the annular polishing pad is 5 to 75%, preferably 30 to 50%, of the external diameter lo of the polishing pad. The ratio of the external diameter of the polishing pad to the external diameter of the substrate w with the metal film that is being polished is 0.5 to 0.75 times in the case of a circular annular pad; in the case of an elliptical annular pad, this ratio is 0.35 to 0.40 times for the short-axis diameter, and 0.5 to 0.75 times for the long-axis diameter.
申请公布号 KR20030028482(A) 申请公布日期 2003.04.08
申请号 KR20027017023 申请日期 2002.12.13
申请人 发明人
分类号 H01L21/304;B24B37/04;B24B37/26;B24D13/14 主分类号 H01L21/304
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