发明名称 Automatic delay element insertion system for addressing holdtime problems
摘要 Hold time methods, systems, and computer program products are implemented to ensure that storage elements in a circuit have sufficient hold times without detrimentally affecting cycle times for other paths in the circuit. Electric circuits are designed by determining which storage elements have hold-time deficiencies, and by inserting an appropriate time delay element in a selected path preceding the storage element, or at a source or destination storage element, without exceeding a predetermined cycle time in a second path that overlaps the first path, for at least one storage element in an electrical circuit. The invention simulates insertion of the time delay element before or after a logic element that precedes a storage element that has a hold-time deficiency. The invention determines which storage elements and which circuit paths between adjacent storage elements are subject to hold time deficiencies, assembles a hold time deficiency list, and determines whether a selected hold-time-deficient storage element can be preceded with a delay element without violating a cycle time constraint in another cycle path. The invention further includes determining the placement of a delay element in a storage system having a network of storage elements interconnected with logic elements by using a criterion that protects cycle times in other storage element paths with slower signal propagation. The method further includes modifying a net list of storage and logic element interconnections to include insertion of one or more time delay elements.
申请公布号 US6546531(B1) 申请公布日期 2003.04.08
申请号 US20000684284 申请日期 2000.10.06
申请人 SUN MICROSYSTEMS, INC. 发明人 QUACH LE;VARADADESIKAN LAKSHMINARASIMHAN;GREENLEY DALE R.
分类号 G06F17/50;(IPC1-7):G06F9/45 主分类号 G06F17/50
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