发明名称 THERMAL ANNEALING FURNACE HAVING QUARTZ PROCESS TUBE
摘要 PROBLEM TO BE SOLVED: To provide a thermal annealing furnace having a quartz process tube, able to produce an annealed wafer with few particles and little metallic contamination without lowering productivity even when the wafer is thermally annealed in an atmosphere of an argon gas, a hydrogen gas or their mixed gas. SOLUTION: In the thermal annealing furnace having the quartz process tube for thermally annealing a semiconductor substrate in an atmosphere of an argon gas, a hydrogen gas or their mixed gas, a first cover member, which covers the inner wall surface of the quartz process tube and which is detachable, is provided in the area outside of the soaking zone on the furnace inlet side of the thermal annealing furnace.
申请公布号 JP2003100763(A) 申请公布日期 2003.04.04
申请号 JP20010289835 申请日期 2001.09.21
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 KOBAYASHI NORIHIRO;TAMAZUKA MASARO;NAGOYA TAKATOSHI
分类号 H01L21/324;(IPC1-7):H01L21/324 主分类号 H01L21/324
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