发明名称 Method of buried strap out-diffusion formation by gas phase doping
摘要 A method of forming a buried strap comprising the following sequential steps. A substrate having a pad oxide layer formed thereover is provided. A masking layer is formed over the pad oxide layer. The masking layer, pad oxide layer and substrate are etched to form a trench within the substrate. The trench having an outer sidewall and an upper portion. The upper portion of the trench is lined with a collar. A poly plate is formed within the trench. The poly plate and collar are etched below the substrate to form a recessed poly plate and a recessed collar and exposing a portion of outer sidewall of trench. Ions are implanted into the substrate through exposed outer sidewall of trench by gas phase doping. A SiN sidewall layer is formed over the exposed outer sidewall of trench at a temperature sufficient to diffuse the implanted ions further into the substrate to form the buried strap.
申请公布号 US2003064598(A1) 申请公布日期 2003.04.03
申请号 US20020195355 申请日期 2002.07.15
申请人 PROMOS TECHNOLOGIES, INC. 发明人 CHUNG JESSE;WANG HSIAO-LEI;LIAO HUNG-KWEI
分类号 H01L21/74;H01L21/8242;(IPC1-7):H01L21/311 主分类号 H01L21/74
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