| 摘要 |
PROBLEM TO BE SOLVED: To provide a method and an apparatus for inspecting surfaces whereby the detecting ability can be improved and costs can be reduced without a photo sensitive material for heat developing being exposed to light even when the photosensitive material is used as a test object. SOLUTION: The surface inspection apparatus 1 for inspecting surface defects of the test object 2 is provided with a light source 3 for irradiating the test object 2 with light, and a sensor 4 for receiving reflecting light or transmitted light from the test object 2. The test object 2 is made the transferred sheet-like photosensitive material for heat developing, and the light source 3 is made a nearly white light source or a light emitting diode. When the light source 3 is made the nearly white light source, a wavelength selecting means 9 is provided for selecting and passing a wavelength of light to be irradiated from the nearly white light source.
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