发明名称 DUAL-SOURCE, SINGLE-CHAMBER METHOD AND APPARATUS FOR SPUTTER DEPOSITION
摘要 The present invention relates to a dual-source, single-chamber method and apparatus for epitaxial sputter deposition of epilayers and high quality films. The apparatus for performing the method includes a first sputtering source (2) for the sputtering of an epitaxial film on a substrate (6). A second sputtering source 4 is for the sputtering of reactive materials to create a getter on a cryogenic shroud (8). The first sputtering source (4) and the substrate (6) are surrounded by the cryogenic shroud (8).
申请公布号 WO03027352(A1) 申请公布日期 2003.04.03
申请号 WO2002US30867 申请日期 2002.09.27
申请人 E.I. DU PONT DE NEMOURS AND COMPANY;CHISTYAKOV, ROMAN 发明人 CHISTYAKOV, ROMAN
分类号 C23C14/34;C23C14/56;C30B23/02;H01J37/34;(IPC1-7):C23C14/34 主分类号 C23C14/34
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