| 摘要 |
PROBLEM TO BE SOLVED: To provide a mark examination method capable of easily determining a reference pattern in examining various marks. SOLUTION: This method comprises a step for outputting the image data by taking an image including a reference mark 1 or a comparison mark 10 by a CCD camera 14, inputting the image data to an image processor 15 from the CCD camera 14, detecting the outermost outline area 5, 50 of the reference mark 1 or the comparison mark 10 from the inputted image data by the image processor 15, and equally dividing the outermost outline area 5, 50 to reference blocks 6 or comparison blocks 60. Thus the same determination method can be easily shared regardless of the constitution of the mark. |
